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Your Advantages
- Measuring in confined spaces starting from Ø 0.1 mm
- High-resolution non-contact measurements
- Non-contact and wear-free operation
- Suitable for fast 100-percent inspection processes
- Compatible with a wide range of materials and surfaces
- Single-point and multi-point measurements possible
- Generation of 2D profiles and 3D point clouds
- Support for DIN EN ISO compliant quality control
- Automation and system integration capable
- Electromagnetic compatibility (EMC)
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System characteristics
FDM-1
For High-Resolution Measurement Tasks
| Measuring range |
80 µm |
| Distance-equivalent noise |
< 15 nm |
| Diameter of the measuring probe |
from 50 µm |
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FDM-2
For Extended Measurement Ranges
| Measuring range |
1 mm |
| Distance-equivalent noise |
< 100 nm |
| Diameter of the measuring probe |
from 50 µm |
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General parameters
Measurement principle |
low coherence interferometry |
Probe diameter |
0.05 / 0.08 / 0.125 / 0.8 / 1.3 – 5 mm |
Measurable materials and surfaces |
Glas, metal, ceramics, plastic etc. – transparent, glossy, matt |
Inner diameter of the tested object |
from 0.1 mm |
Direction of measurement |
axial (0°), angular (45° – 90°) |
Measuring frequency |
up to 40 kHz (depending on the surface) |
Multi-point measurement |
parallel or sequential read-out from multiple probes |
Software |
FDMControl (control software) / DataViewer (analysis software) |
Programming interfaces |
API, DLL |
System interfaces (configurable) |
Trigger IN, Gate IN, Trigger OUT: TTL 5V, Ethernet, GPIO |
Power supply |
100–240 V AC, 50/60 Hz |
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Applications