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Your benefits
- Measuring in the smallest of spaces (from Ø 0.1 mm)
- Results with nanometer accuracy
- Non-contact and wear-free
- 100-percent inspection capability
- Almost material and surface-independent
- Single-point and multi-point measurements possible
- Generation of 2D profiles and 3D point clouds
- Standards-compliant quality control according to DIN EN ISO
- Easy-to-automate and fully integrable
- Electromagnetic compatibility (EMC)
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System characteristics
FDM-1
Highest accuracy
| Measuring range |
80 µm |
| Resolution (typical standard deviation) |
< 3 nm* |
| Diameter of the measuring probe |
≥ 50 µm |
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FDM-2
Large measuring range
| Measuring range |
1 mm |
| Resolution (typical standard deviation) |
< 10 nm* |
| Diameter of the measuring probe |
≥ 50 µm |
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General parameters
Measurement principle |
low coherence interferometry |
Probe diameter |
0.05 / 0.08 / 0.125 / 0.8 / 1.3 – 5 mm |
Measurable materials and surfaces |
Glas, metal, ceramics, plastic etc. – transparent, glossy, matt |
Inner diameter of the tested object |
from 0.1 mm |
Direction of measurement |
axial (0°), angular (45° – 90°) |
Measuring frequency |
up to 20 kHz (depending on the surface) |
Multi-point measurement |
parallel or sequential read-out from multiple probes |
Software |
FDMControl (control software) / DataViewer (analysis software) |
Programming interfaces |
API, DLL |
System interfaces (configurable) |
Trigger IN, Gate IN, Trigger OUT: TTL 5V, Ethernet, GPIO |
Power supply |
230 V (AC) |
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Applications